IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
°°° defect level
for powders consisting of graphene-based material by
°°° Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D°°° band and 2D band in Raman spectrum, ID+D°°°/I2D.
°°° The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
°°° The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
°°° Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
°°° The method described in this document is appropriate if the physical form of graphene is powder.
| Edition : | 1.0 |
| File Size : | 1
file
, 3.2 MB |
| Note : | This product is unavailable in Canada |
| Number of Pages : | 28 |
| Published : | 10/27/2020 |
